Metric learning for event-related potential component classification in EEG signals.
Qi LiuXiaoguang ZhaoZeng-Guang HouPublished in: EUSIPCO (2014)
Keyphrases
- eeg signals
- event related
- brain computer interface
- metric learning
- brain activity
- distance metric learning
- event related potentials
- signal processing
- distance metric
- feature space
- multi task
- eeg data
- training set
- pairwise
- feature extraction
- classification accuracy
- computer vision
- semi supervised
- distance function
- extracted features
- text classification
- learning tasks
- image classification
- decision trees
- machine learning
- independent component analysis
- pattern classification
- unsupervised learning
- neural network
- multi class
- support vector machine
- high dimensional
- pattern recognition
- data mining