Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability.
L. ReganazDamien DeleruyelleQuentin RafhayJoel Minguet LopezNiccolo CastellaniJean-François NodinAlessandro BricalliGiuseppe PiccolboniGabriel MolasFrançois AndrieuPublished in: IRPS (2023)
Keyphrases
- temporal information
- high impact
- temporal data
- spatio temporal
- temporal reasoning
- temporal constraints
- memory usage
- reliability assessment
- spatial locality
- information technology
- memory requirements
- factors that influence
- temporal databases
- temporal consistency
- computing power
- real time
- random access
- temporal relations
- memory space
- temporal patterns
- motion estimation
- digital forensics
- website
- low memory
- genetic algorithm
- databases