Universal Test Sets for Logic Networks.
Sheldon B. Akers Jr.Published in: IEEE Trans. Computers (1973)
Keyphrases
- test set
- error rate
- training set
- test data
- multi valued
- evaluation methodology
- test cases
- neural network
- modal logic
- logic programming
- computer networks
- training data
- network analysis
- social networks
- network structure
- database
- temporal logic
- data mining
- logic programs
- supervised learning
- support vector machine
- data points