Extending the Viability of IDDQ Testing in the Deep Submicron Era.

Y. Tsiatouhas Th. Haniotakis Dimitris Nikolos Angela Arapoyanni

Published in: ISQED (2002)

Keyphrases

vlsi circuits
correlation analysis
neural network
hidden markov models
databases
genetic algorithm
bayesian networks
low cost
low power
software testing
electron beam