C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
ELURA: A Methodology for Post-Silicon Gate-Level Error Localization Using Regression Analysis.
Ankit Jindal
Binod Kumar
Kanad Basu
Masahiro Fujita
Published in:
VLSI Design (2018)
Keyphrases
</>
regression analysis
regression model
factor analysis
correlation analysis
linear regression model
explanatory variables
independent variables
dependent variables
localization error
high density
cmos technology
linear regression models
high speed
field effect transistors
silicon dioxide