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X-Tolerant Tunable Compactor for In-System Test.

Yingdi LiuSylwester MilewskiGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy TyszerBartosz Wldarczak
Published in: ITC (2020)
Keyphrases
  • information retrieval
  • neural network
  • genetic algorithm
  • information systems
  • image processing
  • high level
  • lower bound
  • artificial neural networks
  • data model
  • test cases
  • test data