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Scan Test Data Volume Reduction for SoC Designs in EDT Environment.

Guoliang LiJun QianYuan ZuoRui LiQinfu Yang
Published in: Asian Test Symposium (2013)
Keyphrases
  • test data
  • test set
  • test cases
  • training data
  • data sets
  • training set
  • testing process
  • training and test data
  • databases
  • data mining
  • computer vision
  • support vector machine
  • supervised learning
  • missing values