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Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS.

Peter MoensGeert Van den Bosch
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • reliability assessment
  • power consumption
  • bp neural network model
  • power system
  • low power
  • high power
  • high density
  • neural network
  • real world
  • computer vision
  • database
  • decision making
  • fuzzy logic
  • bp neural network