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X-ray and UV controlled adjustment of MOS VLSI circuits threshold voltages.
M. N. Levin
V. R. Gitlin
S. G. Kadmensky
S. S. Ostrouhov
V. S. Pershenkov
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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x ray
vlsi circuits
x ray images
medical imaging
intraoperative
low power
digital x ray images
projection images
three dimensional
electron microscopy
ct scans
mixed signal
transmission electron microscopy
metal oxide
tomographic images
multi channel
dual energy
real time