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gate dielectrics for AlGaN/GaN HEMT.

J. ChenTakamasa KawanagoHitoshi WakabayashiKazuo TsutsuiHiroshi IwaiD. NohataHiroshi NohiraKuniyuki Kakushima
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • gate dielectrics
  • electrical properties
  • structuring elements
  • si sio
  • field effect transistors
  • reinforcement learning
  • wavelet transform
  • steady state