A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers.
Muhammad NummerManoj SachdevPublished in: J. Electron. Test. (2003)
Keyphrases
- high speed
- test cases
- software testing
- low power
- frequency domain
- real time
- frame rate
- shift register
- object oriented
- test suite
- discrete fourier transform
- high speed networks
- unit testing
- test set
- feature vectors
- information retrieval
- image reconstruction
- test data
- fourier transform
- data mining
- neural network
- data sets
- delay insensitive
- database