Transistor Sizing for Parameter Obfuscation of Analog Circuits Using Satisfiability Modulo Theory.

Vaibhav Venugopal Rao Ioannis Savidis

Published in: APCCAS (2018)

Keyphrases

analog circuits
digital circuits
high speed
fault diagnosis
power dissipation
neural network
propositional logic
low cost
np complete
reverse engineering
integrated circuit
satisfiability testing