SATISFIABILITY TESTING
Experts
- Bart Selman
- Shaowei Cai
- Pierre Marquis
- Moshe Y. Vardi
- Kuldeep S. Meel
- Stefan Szeider
- Yang Xu
- Chu Min Li
- Philippe Codognet
- Allen Van Gelder
- Guy Van den Broeck
- Alejandro Arbelaez
- Ashish Sabharwal
- John Thornton
- Abdul Sattar
- Christian J. Muise
- Yuefei Sui
- Kaile Su
- Paul Beame
- Peter J. Stuckey
- Camillo Fiorentini
- Angelika Kimmig
- Jérôme Lang
- Armin Biere
- Antti Kuusisto
- Markus Hecher
- Henry A. Kautz
- Duc Nghia Pham
- Luciano Serafini
- Johannes Klaus Fichte
- Sanjit A. Seshia
- Jun Gu
- Stefan Woltran
- Holger H. Hoos
- Mauricio G. C. Resende
- Karem A. Sakallah
- Andrei Voronkov
- Lukas Kroc
- Supratik Chakraborty
Venues
- CoRR
- SAT
- AAAI
- IJCAI
- Notre Dame J. Formal Log.
- Theor. Comput. Sci.
- Stud Logica
- J. Log. Comput.
- Artif. Intell.
- Math. Log. Q.
- J. Symb. Log.
- Log. J. IGPL
- J. Autom. Reason.
- Electron. Colloquium Comput. Complex.
- CP
- TABLEAUX
- ICTAI
- Arch. Math. Log.
- J. Heuristics
- ACM Trans. Comput. Log.
- Ann. Pure Appl. Log.
- KR
- Ann. Math. Artif. Intell.
- ECAI
- J. Philos. Log.
- Inf. Process. Lett.
- CSL
- MFCS
- CADE
- Australian Conference on Artificial Intelligence
- LICS
- GECCO
- Constraints An Int. J.
- AAAI/IAAI
- 计算机科学
- Discret. Appl. Math.
- LFCS
- KI
- J. ACM
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Related Keywords
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