Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway.

Don L. Millard Karl R. Umstadter Robert C. Block

Published in: IEEE Des. Test Comput. (1992)

Keyphrases

electronic circuits
low voltage
high speed
test cases
data sets
high density
physical characteristics
chemical reactions
computer science
test set
thin film
software testing
transmission line
analog circuits
tunnel diode