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BIST of PCB interconnects using boundary-scan architecture.

Abu S. M. HassanVinod K. AgarwalBenoit Nadeau-DostieJanusz Rajski
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1992)
Keyphrases
  • management system
  • input output
  • real time
  • data sets
  • software architecture
  • defect detection
  • layered architecture
  • databases
  • image segmentation
  • object boundaries