Test Input Prioritization for Machine Learning Classifiers.
Xueqi DangYinghua LiMike PapadakisJacques KleinTegawendé F. BissyandéYves Le TraonPublished in: IEEE Trans. Software Eng. (2024)
Keyphrases
- machine learning
- machine learning algorithms
- machine learning methods
- decision trees
- training data
- feature selection
- machine learning approaches
- input features
- supervised classification
- test data
- learning algorithm
- artificial intelligence
- naive bayes
- fold cross validation
- learning classifier systems
- linear classifiers
- support vector
- statistical tests
- data mining
- statistical methods
- information extraction
- pattern recognition
- text mining
- classification systems
- ensemble learning
- learning tasks
- classification algorithm
- test cases
- computer vision
- training examples
- training samples
- feature set
- feature ranking
- regression testing
- active learning
- classification accuracy
- support vector machine
- classification rate
- supervised learning
- svm classifier
- natural language processing
- model selection
- computational intelligence