A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC.
Manuel J. BarraganRshdee AlhakimHaralampos-G. D. StratigopoulosMatthieu DuboisSalvador MirHervé Le GallNeha BhargavaAnkur BalPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2016)