dielectric n-MOSFETs under positive bias temperature instability.

Giyoun Roh Hyeokjin Kim Cheolgyu Kim Dongwoo Kim Bongkoo Kang

Published in: Microelectron. Reliab. (2017)

Keyphrases

chemical vapor deposition
positive and negative
artificial intelligence
databases
positively correlated
information systems
feature selection
image sequences
high resolution
low cost
thin film
transmission line
low voltage
high temperature