Hyeokjin Kim

Publication Activity (10 Years)

Years Active: 2013-2017
Publications (10 Years): 1

Top Topics

Thermal Conductivity

Field Effect Transistors

Positive And Negative

Room Temperature

Top Venues

Microelectron. Reliab.

Publications

Giyoun Roh, Hyeokjin Kim, Cheolgyu Kim, Dongwoo Kim, Bongkoo Kang
dielectric n-MOSFETs under positive bias temperature instability. Microelectron. Reliab. 72 (2017)
Cheolgyu Kim, Hyeokjin Kim, Bongkoo Kang
nMOSFETs under positive bias temperature instability. Microelectron. Reliab. 54 (11) (2014)
Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. Microelectron. Reliab. 53 (9-11) (2013)