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Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits.
Anzhela Yu. Matrosova
Valeriy B. Lipskii
Published in:
Autom. Remote. Control. (2015)
Keyphrases
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built in self test
power dissipation
high speed
test cases
vlsi circuits
logical operations
pairwise
integrated circuit
linearly independent
logical properties
model based diagnosis
power consumption
vector space
fault diagnosis
shortest path
chip design
sufficient conditions
fuzzy logic