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Microprocessor Testing: Which Technique is Best? (Panel).

Jacob A. AbrahamSandip KunduJanak H. PatelManuel A. d'AbreuBulent I. DervisogluMarc E. LevittHector R. SucarRon G. Walther
Published in: DAC (1994)
Keyphrases
  • high speed
  • test cases
  • design methodology
  • real time
  • data mining
  • information systems
  • decision making
  • database systems
  • sensor networks
  • test set
  • test generation