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Investigation of surface roughness effects for D-band SIW transmission lines on LCP substrate.

Sensen LiMing YiSpyridon PavlidisHuan YuMadhavan SwaminathanJohn Papapolymerou
Published in: RWS (2017)
Keyphrases
  • transmission line
  • surface roughness
  • power system
  • differential equations
  • specular reflection
  • manufacturing process
  • image processing
  • quality control
  • curved surfaces
  • image formation