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Fault modeling and testing of through silicon via interconnections.
Vasileios Gerakis
Leonidas Katselas
Alkis A. Hatzopoulos
Published in:
IOLTS (2015)
Keyphrases
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high density
test cases
case study
fault diagnosis
fault detection
real time
neural network
information retrieval
low cost
high speed
learning algorithm
social networks
expert systems