• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Fault modeling and testing of through silicon via interconnections.

Vasileios GerakisLeonidas KatselasAlkis A. Hatzopoulos
Published in: IOLTS (2015)
Keyphrases
  • high density
  • test cases
  • case study
  • fault diagnosis
  • fault detection
  • real time
  • neural network
  • information retrieval
  • low cost
  • high speed
  • learning algorithm
  • social networks
  • expert systems