Login / Signup
Sheet resistance measurement of thin metallic films and stripes at both 130 GHz and DC.
Ming-Han John Lee
Richard J. Collier
Published in:
IEEE Trans. Instrum. Meas. (2005)
Keyphrases
</>
metal oxide
rf sputtering
high speed
neural network
structured light
grain size
real time
data acquisition
database
data sets
magnetic field
measurement model