Login / Signup

Sheet resistance measurement of thin metallic films and stripes at both 130 GHz and DC.

Ming-Han John LeeRichard J. Collier
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • metal oxide
  • rf sputtering
  • high speed
  • neural network
  • structured light
  • grain size
  • real time
  • data acquisition
  • database
  • data sets
  • magnetic field
  • measurement model