Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination.
Chunlei MeiMaoxiang YiZhifei ShenPublished in: TrustCom (2011)
Keyphrases
- test data
- low power
- test cases
- power dissipation
- test set
- power consumption
- training data
- pattern matching
- low cost
- testing process
- data sets
- high speed
- power reduction
- error rate
- training set
- hardware and software
- databases
- training and test data
- cmos technology
- real time
- decision trees
- learning algorithm
- test generation