Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits.
Yu PuXin ZhangKatsuyuki IkeuchiAtsushi MuramatsuAtsushi KawasumiMakoto TakamiyaMasahiro NomuraHirofumi ShinoharaTakayasu SakuraiPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2011)