Stuck-at Fault Resilience using Redundant Transistor Logic Gates.
Richard McWilliamPhilipp SchieferAlan PurvisSamir KhanPublished in: DASC/PiCom/DataCom/CyberSciTech (2019)
Keyphrases
- logic circuits
- low power
- high speed
- fault diagnosis
- integrated circuit
- fault detection
- power consumption
- classical logic
- logic programming
- modal logic
- fault models
- neural network
- fault model
- proof theory
- power dissipation
- missing data
- defeasible logic
- computational properties
- multi valued
- fault management
- highly redundant
- description logics