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Current-Voltage Relations for Electrochemical Thin Films.

Martin Z. BazantKevin T. ChuB. J. Bayly
Published in: SIAM J. Appl. Math. (2005)
Keyphrases
  • short circuit
  • thin film
  • room temperature
  • power system
  • multi layer
  • grain size
  • databases
  • high density
  • neural network
  • database systems
  • viewpoint
  • feed forward
  • film thickness
  • chemical vapor deposition
  • plasma etching