Functional Testing of Microprocessors with Graded Fault Coverage.

Rajesh Kannah C. P. Ravikumar

Published in: Asian Test Symposium (2000)

Keyphrases

test cases
hidden markov models
software testing
decision trees
website
web services
feature selection
image sequences
multiscale
neural network
general purpose
low cost
test set
information systems
test data
personal computer
test suite
machine learning