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Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.

Noriyoshi ItazakiFumiro MatsukiYasuyuki MatsumotoKozo Kinoshita
Published in: Asian Test Symposium (1998)
Keyphrases
  • built in self test
  • fault diagnosis
  • real time
  • artificial intelligence
  • data sets
  • genetic algorithm
  • gray scale
  • hardware implementation
  • integrated circuit
  • multiple types