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A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design.
Shih-Ping Lin
Chung-Len Lee
Jwu-E Chen
Ji-Jan Chen
Kun-Lun Luo
Wen Ching Wu
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2007)
Keyphrases
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test data
training data
compression scheme
data sets
test cases
data structure
test set
high quality
image segmentation
raw data
missing data
training samples
image data
prior knowledge
missing values
multiresolution
support vector
data records