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Characterization of an SRAM based particle detector for mixed-field radiation environments.

Georgios TsiligiannisLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchAida Todri-SanialArnaud VirazelJulien MekkiMarkus BruggerJ.-R. VailléFrederic WrobelFrédéric Saigné
Published in: IWASI (2013)
Keyphrases
  • dynamic environments
  • x ray
  • real world
  • infrared
  • real time
  • computer vision