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A Practical Threshold Test Generation for Error Tolerant Application.

Hideyuki IchiharaKenta SutohYuki YoshikawaTomoo Inoue
Published in: IEICE Trans. Inf. Syst. (2010)
Keyphrases
  • error tolerant
  • test generation
  • test cases
  • data sets
  • real world
  • image processing
  • search algorithm
  • structured data
  • graph matching
  • static analysis