Gate dielectric breakdown in the time-scale of ESD events.

Bonnie E. Weir Che-Choi Leung Paul J. Silverman Muhammad A. Alam

Published in: Microelectron. Reliab. (2005)

Keyphrases

leakage current
event detection
silicon dioxide
data sets
data mining
real time
neural network
image processing
similarity measure
scale space
small scale
multiple input
gate dielectrics