Bonnie E. Weir

Publication Activity (10 Years)

Years Active: 2005-2019
Publications (10 Years): 1

Top Topics

High Reliability

Fully Understand

Mechanisms Underlying

Top Venues

Publications

Bonnie E. Weir, Vani Prasad, Shahriar Moinian, SangJune Park, Joseph Blasko, Jason Brown, Jayanthi Pallinti
Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits. IRPS (2019)
Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. Alam
Gate dielectric breakdown in the time-scale of ESD events. Microelectron. Reliab. 45 (3-4) (2005)