Login / Signup
A multi-probe approach for MCM substrate testing.
So-Zen Yao
Nan-Chi Chou
Chung-Kuan Cheng
T. C. Hu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
</>
test cases
information retrieval
database
real time
neural network
artificial intelligence
multiresolution
software development
statistical tests
test suite