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Mismatch-Aware Common-Centroid Placement for Arbitrary-Ratio Capacitor Arrays Considering Dummy Capacitors.
Cheng-Wu Lin
Jai-Ming Lin
Yen-Chih Chiu
Chun-Po Huang
Soon-Jyh Chang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
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short circuit
metal oxide
standard deviation
real time
data sets
databases
neural network
genetic algorithm
computer vision
x ray
infrared
thin film
arbitrary size