Investigation of BTI reliability for monolithic 3D 6T SRAM with ultra-thin-body GeOI MOSFETs.

Vita Pi-Ho Hu Pin Su Ching-Te Chuang

Published in: ISCAS (2016)

Keyphrases

high speed
low voltage
human body
power consumption
low power
random access memory
data transmission
low cost
failure rate
decision trees
three dimensional
expert systems
computer networks
digital forensics
reliability analysis