AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements.
A. SozzaArnaud CurutchetChristian DuaNathalie MalbertNathalie LabatAndré TouboulPublished in: Microelectron. Reliab. (2006)
Keyphrases
- low frequency
- high frequency
- reliability assessment
- frequency domain
- electromagnetic fields
- wavelet transform
- subband
- wavelet analysis
- discrete wavelet transform
- wavelet coefficients
- original images
- low and high frequency
- high frequency components
- power system
- high resolution
- bp neural network model
- low pass
- measurement noise
- fusion rules
- dct coefficients
- frequency band
- machine learning
- spatial domain
- multiresolution