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A BIST Approach for Testing FPGAs Using JBITS.

Mohammed Y. NiamatSurya S. HejeebuMansoor Alam
Published in: FCCM (2005)
Keyphrases
  • test cases
  • field programmable gate array
  • real time
  • machine learning
  • test data
  • test suite
  • software testing
  • multiscale
  • signal processing
  • lightweight
  • statistical tests
  • hardware implementation