Sign in

Constraint-Based Layout-Driven Sizing of Analog Circuits.

Husni M. HabalHelmut Graeb
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • wavelet packet transform
  • neural network
  • data driven
  • constraint satisfaction
  • machine learning
  • expert systems
  • data model
  • state space