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Duty cycle shift under static/dynamic aging in 28nm HK-MG technology.

Ketul B. SutariaPengpeng RenAbinash MohantyXixiang FengRunsheng WangRu HuangYu Cao
Published in: IRPS (2015)
Keyphrases
  • duty cycle
  • dynamic analysis
  • low cost
  • markov random field
  • data processing
  • real time
  • image processing
  • computer systems
  • paradigm shift