Utilizing a Pattern Recognition Controller and Linear Discriminate Analysis for MFL Defect Detection.
Saeedreza EhteramAlborz Rezazadeh SereshkehSeyed Zeinolabedin MoussaviAli SadrAli Akbar JalaliPublished in: J. Convergence Inf. Technol. (2009)
Keyphrases
- defect detection
- pattern recognition
- linear discriminate analysis
- feature extraction
- neural network
- principal component analysis
- image processing
- control system
- real time
- machine learning
- image analysis
- pattern recognition problems
- pattern classification
- computer vision
- fuzzy controller
- control algorithm
- closed loop
- machine vision
- control law
- support vector machine svm
- image classification
- automated visual inspection
- dimensionality reduction
- control strategy
- optimal control
- control method
- adaptive control