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Inspection of Imprint Defects in Stamped Metal Surfaces Using Deep Learning and Tracking.
Sylvio Biasuz Block
Ricardo Dutra da Silva
Leyza Baldo Dorini
Rodrigo Minetto
Published in:
IEEE Trans. Ind. Electron. (2021)
Keyphrases
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deep learning
defect detection
unsupervised learning
unsupervised feature learning
automated visual inspection
machine learning
particle filter
deep architectures
three dimensional
particle filtering
mental models
object tracking
learning algorithm
mean shift
appearance model