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PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs.

Daniela De VenutoLeonardo Reyneri
Published in: DATE (2008)
Keyphrases
  • high resolution
  • built in self test
  • low resolution
  • super resolution
  • high quality
  • remote sensing
  • high frequency
  • satellite images
  • feature vectors
  • mobile robot
  • test cases
  • test data
  • image generation
  • duty cycle