Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids.
Valeriy SukharevArmen KteyanFarid N. NajmYong Hyeon YiChris H. KimJun-Ho ChoySofya TorosyanYu ZhuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)