A method for the estimation of defect detection probability of analog/RF defect-oriented tests.

John Liaperdos Angela Arapoyanni Yiorgos Tsiatouhas

Published in: DATE (2015)

Keyphrases

defect detection
detection method
support vector machine svm
high precision
preprocessing
significant improvement

experimental evaluation
estimation algorithm
classification method
synthetic data
mutual information
model selection

neural network
high accuracy
test data
computational cost
estimation accuracy
cross entropy

objective function
maximum likelihood
segmentation method
probabilistic model
cost function
maximum likelihood estimation