A method for the estimation of defect detection probability of analog/RF defect-oriented tests.
John LiaperdosAngela ArapoyanniYiorgos TsiatouhasPublished in: DATE (2015)
Keyphrases
- defect detection
- detection method
- support vector machine svm
- high precision
- preprocessing
- significant improvement
- experimental evaluation
- estimation algorithm
- classification method
- synthetic data
- mutual information
- model selection
- neural network
- high accuracy
- test data
- computational cost
- estimation accuracy
- cross entropy
- objective function
- maximum likelihood
- segmentation method
- probabilistic model
- cost function
- maximum likelihood estimation