Test Integration for SOC Supporting Very Low-Cost Testers.
Chun-Chuan ChiChih-Yen LoTe-Wen KoCheng-Wen WuPublished in: Asian Test Symposium (2009)
Keyphrases
- low cost
- low power
- test cases
- hardware and software
- hardware software co design
- embedded systems
- software testing
- decision support
- cost effective
- data integration
- image processing
- object oriented
- source code
- data sets
- multiscale
- feature selection
- data acquisition
- computer vision
- artificial intelligence
- data mining
- test suite
- neural network
- content management
- testing process
- databases