Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.
Lucas Matana LuzaAnnachiara RuospoDaniel SöderströmCarlo CazzanigaMaria KastriotouErnesto SánchezAlberto BosioLuigi DililloPublished in: IEEE Trans. Emerg. Top. Comput. (2022)
Keyphrases
- reliability assessment
- neural network
- pattern recognition
- bp neural network model
- x ray
- infrared
- fuzzy logic
- residual errors
- multilayer perceptron
- neural network model
- self organizing maps
- software defect
- artificial neural networks
- genetic algorithm
- recurrent neural networks
- power system
- reinforcement learning
- data sets
- case study
- prediction error
- error analysis
- hopfield neural network
- social networks
- computational intelligence
- image registration