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Radiation sensitivity of XOR topologies in multigate technologies under voltage variability.

Ygor Q. de AguiarCristina MeinhardtRicardo A. L. Reis
Published in: LASCAS (2017)
Keyphrases
  • x ray
  • metal oxide
  • power system
  • infrared
  • power supply
  • real time
  • website
  • st century
  • human factors
  • duty cycle
  • artificial intelligence
  • information systems
  • computational intelligence
  • electrical properties
  • power losses